TAF 17025 Testing Laboratory
We have seven measurement technologies related to material measurement and analysis that have been accredited:
AFM step height measurement, AFM line width measurement, TEM line width measurement, SEM line width measurement, SIMS boron depth profile, X-ray diffractometer phase identification, and X-ray photoelectron spectroscopy surface qualitative analysis. These certifications have been accredited by the Taiwan Accreditation Foundation (TAF) in compliance with ISO/IEC 17025. We provide related testing services and continues to enhance its measurement capabilities while expanding its certification scope.
AFM step height measurement, AFM line width measurement, TEM line width measurement, SEM line width measurement, SIMS boron depth profile, X-ray diffractometer phase identification, and X-ray photoelectron spectroscopy surface qualitative analysis. These certifications have been accredited by the Taiwan Accreditation Foundation (TAF) in compliance with ISO/IEC 17025. We provide related testing services and continues to enhance its measurement capabilities while expanding its certification scope.
Accreditation Fee
TAF-ISO17025 Crtificate Fee: Academic community: NTD5,000/certificate; industry community: NTD10,000/certificate.
Accreditation Process
Make a reservation with the contact person → Send samples for testing → Testing and measurement → Report review → Payment → Take back the samples and get the report
Point of Contact
Mr. Chou Ext. 7553 or 7424
E-mail: thchou@niar.org.tw
TAF Test Report Sample
(Please click the link to open the sample for use by internal staff)